Product
Quartz Sand
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Place of Origin:USA
Added:2023-03-23
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Details

  • Silicon Dioxide (SiO₂) Purity:

    • Over 99.99%, ensuring minimal impurities that could affect semiconductor performance.

  • Trace Impurities:

    • Extremely low levels of aluminum, calcium, and iron, usually measured in parts per million (ppm), to prevent contamination.

  • Hydroxyl (OH) Content:

    • Below 30 ppm, as low OH content is critical for high-temperature stability.

  • Thermal Properties:

    • Softening Point: Around 1710°C.

    • Annealing Temperature: Approximately 1220°C.

    • These high thermal resistance properties allow the quartz to withstand the Czochralski process used in silicon wafer production.

  • Optical Transmission:

    • Over 90% transparency in the near-ultraviolet (NUV) range, which is necessary for optical components in semiconductor processes.

  • Bubble Content:

    • Virtually bubble-free to maintain consistency in quality during processing.

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